The Department of Science and Technology (DOST) on Wednesday said it recently acquired an equipment capable of analyzing materials and can also detect defects at a nanoscale level.
The new equipment, field emission scanning electron microscope (FE-SEM), is housed at the Advanced Device and Materials Testing Laboratory (ADMATEL) inside the DOST Compound.
It will be used with the energy dispersive X-ray and electron backscatter diffraction analyzer to expand ADMATEL’s capabilities in failure analysis and material characterization.
According to the DOST, the FE-SEM will help companies improve product quality and reduce delays in the production of electronic devices like smartphones and laptops.
“Investing in a FE-SEM is a strategic step toward strengthening the country’s advanced research and manufacturing capabilities. With its ability to reveal materials at the nanoscale, this technology enables precise characterization of nanoparticles, nanotubes, and advanced materials, as well as detailed analysis of thin films and multi-layer coatings essential to modern technologies,” DOST Secretary Renato Solidum Jr. was quoted in a news release.
Expected users of FE-SEM are semiconductor companies, academic institutions and research organizations.
The DOST said the FE-SEM can also analyze biological samples and advanced nanomaterials, making it a versatile tool for multidisciplinary research.
The equipment will help enable precise examination of device structures, interfaces, materials behavior and process-induced variations that may directly affect performance and reliability, the DOST said. (PNA)
